In order to solve the problems of complex test function, low test efficiency and poor test stability of microwave chip, a multi-project wafer(MPW)test system based on virtual instrument was designed. Using virtual instrument as the programming language of software tool, the functions of probe station motion control, instrument test control, data acquisition and analysis processing with multi-project test as the core are designed to meet the needs of microwave chip MPW test. The experimental results show that the test system can make Wafer Map by the wafer drawing software tool and send it to the wafer test software tool for multi-project location identification. According to the designed test process, the instrument and probe table can be controlled to realize the multi-project wafer test task of microwave chip. The test system can be flexibly applied to various types of MPW test scene. Compared with the limitation that the conventional wafer test system can not efficiently complete the multi-project test, the multi-project wafer test efficiency of microwave chips can be greatly improved and the test cost can be reduced.