基于ATE的FPGA自动重配置系统设计与验证
2024,32(12):263-269
摘要：针对FPGA内各逻辑资源和电性能参数的自动批量配置测试问题，提出了一种将自动重配置模块、ATE测试平台和上位机软件相结合的应用程序自动重配置系统方案。通过上位机软件在自动重配置模块中完成待测FPGA的应用程序加载，实现软硬件结合。基于XC7A100T型FPGA搭建自动重配置系统，运用三段式状态式实现应用程序自动下载。实验结果表明，该系统可实现待测FPGA在多种配置模式下应用程序自动下载，完成待测FPGA芯片的逻辑资源和电性能参数自动批量测试。对于XC6SLX16-2CSG324-T型FPGA，从并模式下自动配置测试时间仅需7分钟，极大节省了应用程序配置时间，满足各类FPGA自动批量测试需求。
关键词：FPGA测试；自动重配置系统；质量可靠性；自动批量测试
Design and Verification of Automatic Reconfiguration System Based on ATE for FPGA
Abstract：Addressing the issue of automatic batch configuration testing for various logic resources and electrical performance parameters within an FPGA, a scheme for an automatic reconfiguration system application is proposed. This scheme integrates an auto-reconfiguration module, an ATE test platform, and host computer software based on the general application configuration method of FPGA chips. The host computer software completes the loading of the application to be tested into the auto-reconfiguration module, achieving a combination of software and hardware. An automatic reconfiguration system is constructed using the XC7A100T type FPGA, employing a three-state approach to realize the automatic downloading of applications. Experimental results indicate that the system can automatically download applications under multiple configuration modes for the FPGA being tested, completing automatic batch testing of the FPGA chip's logic resources and electrical performance parameters. For the XC6SLX16-2CSG324-T type FPGA, automatic configuration testing in parallel mode takes only 7 minutes, significantly saving application configuration time and meeting the needs of various FPGA automatic batch tests.
Key words：FPGA testing；Automatic reconfiguration system；Quality reliability；Automatic batch test
收稿日期：2024-05-23
基金项目：
