国产超大规模集成电路测试系统综合试验验证方法

2022,30(8):277-282
闫丽琴, 冯建呈, 王占选, 殷晔, 刘莹, 李小龙
北京航天测控技术有限公司
摘要:为全面验证国产超大规模集成电路测试系统的工作指标和性能,提出测试系统的一种综合试验验证方法,根据测试系统不同的验证阶段,分别从系统仪器技术指标测试试验验证、系统软硬件功能测试试验验证和系统集成电路测试能力试验验证三个阶段开展综合试验,并针对各阶段的验证方法开展测试系统的试验验证实例分析,验证实例结果表明该综合试验验证方法能够全方位验证国产超大规模集成电路测试系统的工作指标、功能性能以及测试能力,进一步验证所述方法的可行性;该验证方法能够有效解决集成电路测试系统投入测试应用前的试验验证问题,也为新研集成电路测试系统的指标与功能性能验证提供一种有效的综合验证思路。
关键词:国产超大规模集成电路测试系统;综合试验验证方法;技术指标测试;软硬件功能测试;测试能力试验验证

Research on Comprehensive Test Validation Method of Domestic Very-large-scale Integration Test System

李小龙
Abstract:Based on the development of a domestic Very-large-scale Integration (VLSI) test system, we conducted a comprehensive test validation method research. According to the test verification targets of different stages, we have researched on some methods respectively from the test system instruments indicators test and verification stage, integrated circuit test and verification stage oriented to the system hardware and software functions and the test and verification stage based on the typical domestic VLSI. We had paid more attention to the specific test verification work, and further verified the feasibility of the proposed method. This method also provided an effective integrated test and verification idea for the new integrated circuit test system.
Key words:domestic VLSI test system; technical index test; functional test of hardware and software; test capability verification; comprehensive test and verification method
收稿日期:2021-12-30
基金项目:
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